Electron Microscopes  


Information on:
Analytical Services
Instrumentation
Sample Preparation Faculty/Contact Information
NKU Biological Sciences
Faculty Research
Student Research
Gallery 1
Gallery 2
 Gallery 3
Laboratory Calendar
Home

 The SEM laboratory has three Scanning Electron Microscopes (SEM), an FEI Quanta 200 Environmental SEM (ESEM), a Hitachi S-570 SEM, and a Zeiss DSM 960A SEM.  All of the SEMs have secondary and backscattered electron detectors and digital image capture.  Each microscope is housed in its own dedicated room.  The ESEM is our primary teaching microscope, and has a projector that can put the display on the screen pictured for classes and demonstrations. We also have a variety of sample preparation equipment and have build a TEM/STEM sample holder that has been used with both the FEI and Hitachi microscopes.    
FEI Quanta 200 ESEM

The FEI Quanta 200 ESEM is capable of resolving 4 nm at 30 kV in high vacuum mode.  It has secondary and backscattered electron detectors, as well as environmental secondary electron detectors. 

The ESEM can be used in its environmental mode for analyzing non-conductive samples, as well as samples that have not had any special treatment or metal coatings prior to analysis.

The ESEM  is equipped with a Princeton Gamma Tech (PGT) Avalon Microanalysis system, which allows users to conduct bulk chemical analysis and map the distribution of different elements with a spatial resolution of approximately 1 micron. 

The system also has an integrated image analysis (SIS) capability.  Measurements can be taken directly from images captured using the ESEM, and exported directly to spreadsheets, or databases.  

  Hitachi S-570 SEM

The Hitachi S-570 is a high vacuum instrument capable of resolving 3.5 nm at 25 kV.  It has secondary and backscattered electron detectors as well as an in-lens secondary electron detector.  Images may be saved digitally or with a Polaroid  film camera.  The system is primarily used instructing students and as an  imaging instrument.  It's resolution and high vacuum performance are outstanding, and it can provide users with publication quality images of traditionally prepared samples (sample images).   The Orion image capture system allows for simple calibration and measurement directly from micrographs. 

 
  Rigaku Ultima III X-Ray Diffractometer

The Rigaku XRD was installed in April 2006.  It is utilized for the characterization of powders according to their crystal properties.  The XRD has a copper source, six-sample holder, and 2-theta goniometers. 

The XRD allows users to identify numerous characteristics of compounds, such as: phase identification, quantification of phase fractions, crystal structure, crystallite size, preferred orientation, crystal quantity, crystallinity, residual stress, radial distribution function, thin film orientation and structure, particle size distribution, and multi-layer structure.  It has broad application in geology, chemistry, and material sciences.

  
  Zeiss DSM 960A SEM

The Zeiss DSM 960 A is our latest acquisition.  It is a fully digital SEM, with a fully automated stage, and is capable of 4nm resolution at 30kV.  Images may be saved digitally or with a Polaroid  film camera. It has an Oxford Inca Microanalysis system and gunshot residue package (GSR).  The Oxford system has a complete beam control, and can capture high resolution digital images as well as x-ray spectra and maps.  This is all integrated to a built in image analysis package. 

This system was obtained in April 2005, and installation is currently being completed.